Surface Analysis Laboratory

Digital microscope Keyence VHX-6000  

Keyence.pngDigital microscope for optical imaging in 2D and 3D with high resolution. Stepless magnification selection of 100x – 1000x within one objective. Free objective rotation for visualization in various angles.

 

Veeco Atomic Force Microscope

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Beyond optical diffraction limit, very-high-resolution imaging gathered by touching the surface with a mechanical cantilever. Not only topograph, but various forces are also applicable to image.

 

Physical Electronics Trift V nano TOF II

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PHI’s patented TRIFT mass spectrometer with Parallel Imaging MS/MS provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous high mass peaks identification with parallel tandem MS imaging capability.