Forster, C., Harrant, M., Kirscher, J., Maurer, L., Pelz, G.: "Error Propagation for Cascading Metamodels Applied on an Automotive Electric Drive Application", FDL, 2017, Infineon Technologies AG, Neubiberg, Germany, accepted for publication at FDL 2017

Forster, C., Kirscher, J., Schaller, R., Simon, S., Maurer, L., Pelz, G.: "Lifetime Modeling for a Simulative Evaluation of Package Reliability in an Automotive Applibation, IEEE, CAS, 2017, Infineon Technologies AG, Neubiberg, Germany, accepted for publication at CAS 2017

Weber, J., Kaschani, K.T., Gieser, H., Wolf, H., Maurer, L., Famulok, N., Moser, R., Rajagopal, K., Sellmayer, M., Sharma, A., Tamm, H.: "Correlation study of different CDM testers and CC-TLP", 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Pages: 1-10, 2017

Ammer. M., Esmark, K., zur Nieden, F., Rupp, A., Cao, Y., Sauter, M., Maurer, L.: "How to build a Generic Model of complete ICs for system ESD and electrical stress simulation?", 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Pages: 1-10, 2017

Weber, J., Reinprecht, W., Gieser, H., Wolf, H., Maurer, L.: "Correlation limits between capacitively coupled transmission line pulsing (CC-TLP) and CDM for a large chip-on-flex assembly", 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Pages: 1-7, 2017

Simon, S., Bhat, D., Rath, A., Kirscher, J., Maurer, L.: "Coverage-driven mixed-signal verification of smart power ICs in a UVM environment", 22nd IEEE European Test Symposium (ETS), Pages: 1-6, 2017

Wursthorn, J., Knapp, H., Al-Eryani, J., Aufinger, K., Maurer, L.: "Absolute mm-wace power sensor using a switching quad output stage", IEEE 17th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), Pages: 40-42, 2017