Kumar, P., Al-Eryani, J., Tas, B., Böhme, E., Vanselow, F., Isa, E., Maurer, L.: "A 400 mV, widest-tunig-band-VCO with a central Frequency of 10.5 GHz and FTR of 2.5 GHz, designed in 22 nm FDSOI CMOS technology", 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Grenoble, France, pp. 1-4, 2019

Kumar, P., Böhme, E., Al-Eryani, J., Bora, P.P., Borggreve, D., Maurer, L.: "A 300 mV, low power VCO with the central Frequency of 4.89 GHz in 22 nm FDSOI", 2019 IEEE Asia-Pacific Microwave Conference (APMC), Singapore, pp. 1378 - 1380, 2019

Bora, P., Borggreve, D., Vanselow, F., Isa, E., Maurer, L.: "A 0.8 V Low-Power 3rd order Sigma-Delta Modulator in 22 nm FD SOI CMOS Process for Sensor Interfaces", 17th IEEE International New Circuits and Systems Conference (NEWCAS), 2019

Weber, J., Fung, R., Wong, R., Wolf, H., Gieser, H., Maurer, L.: "Stress Current Slew Rate Sensitivity of an Ultra-High-Speed Interface IC", IEEE Transactions on Device and Materials Reliability, Pages: 1 -1, 2019

Ammer, M., Rupp, A., Glaser, U., Cao, Y., Sauter, M., Maurer, L.: "Application Example of a Novel Methodology to Generate IC Models for System ESD and Electrical Stress Simulation out of the Design Data", 41st Annual EOS/ESD Symposium (EOS/ESD), 2019

Ammer, M., Miropolskiy, S., Rupp, A., zur Nieden, F., Sauter, M., Maurer, L.: "Characterizing and Modelling Common Mode Inductors at high Current Levels for System ESD Simulations", 41st Annual EOS/ESD Symposium (EOS/ESD), 2019

Bora, P., Borggreve, D., Vanselow, F., Isa, E., Maurer, L.: "A low power Sigma-Delta Modulator in an advanced 22 nm FD SOI CMOS Process for sensor applications", 13th International Conference and Exhibition on Integration Issues of Miniaturized Systems, Pages: 1 - 7, 2019

Ammer, M., Cao, Y., Rupp, A., Sauter, M., Maurer, L.: "Bringing the SEED Approach to the Next Level: Generating IC Models for System ESD and Electrical Stress Simulation out of Design Data", IEEE Transactions on Electromagnietic Compatibility, Pages: 1 -11, 2019

Koch, S., Orr, B., Gossner, H., Gieser, H., Maurer, L.: "Identification of  Soft Failure Mechanisms Triggered by ESD Stress on a Pawered USB 3.0 Interface", IEEE Transactions on Electromagnetic Compatibility, Pages: 20 - 28, 2019