Publications :: LRT2 - Institut für Angewandte Physik und Messtechnik

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Positron related publications

Ion related publications

 

 

Positron related publications:

2003

  • Hautakangas, S., Oila, J., Alatalo, M., Saarinen, K., Liszkay, L., Seghier, D., Gislason, H. P.: Vacancy Defects as Compensating Centers in Mg-Doped GaN. Physical Review Letters 90 (2003) 137402.
  • Algers, J., Sperr, P., Egger, W., Kögel, G., Maurer, F. H. J.: Median implantation depth and implantation profile of 3–18 keV positrons in amorphous polymers. Physical Review B 67 (2003), 125404.

2002

  • Slugen, V., Kögel, G., Sperr, P., Triftshäuser, W.: Investigation of Defect Distributions in Neutron-Irradiated and Thermally Treated Reactor Steels by Positron Annihilation. Applied Surface Science 194 (2002), 150-154.
  • Krause-Rehberg, R., Börner, F., Redmann, F., Egger, W., Kögel, G., Sperr, P., Triftshäuser, W.: Improved Defect Profiling with Slow Positrons. Applied Surface Science 194 (2002), 210-213.
  • Egger, W., Kögel, G., Sperr, P., Triftshäuser, W., Rödling, S., Bär, J., Gudladt, H.-J.: Vacancy Clusters Close to a Fatigue Crack Observed with the Munich Scanning Positron Microscope. Applied Surface Science 194 (2002), 214-217.
  • Britton, D.T., Härting, M., Hempel, A., Kögel, G., Sperr, P., Triftshäuser, W., Hempel, M., Knoesen, D.: Positron States in Hydrogenated Amorphous Silicon. Journal of Non-Crystalline Solids 299-302 (2002), 249-253.
  • Barthe, M.-F., Desgardin, P., Henry, L., Corbel, C., Britton, D.T., Kögel, G., Sperr, P.,Triftshäuser, W., Vicente, P., di Cioccio, L.: Vacancy Defects in as-polished and in High-Fluence Hydrogen Implanted 6H-SiC Detected by Slow Positron Annihilation Spectroscopy. Materials Science Forum 389-393 (2002), 493-496.
  • Slugen, V., Kögel, G., Sperr, P., Triftshäuser, W.: Positron Annihilation Studies of Neutron Irradiated and Thermally Treated Reactor Pressure Vessel Steels. Journal of Nuclear Materials 302 (2002), 89-95.
  • Hugenschmidt, C., Kögel, G., Repper, R., Schreckenbach, K., Sperr, P., Straßer, B., Triftshäuser, W.: Monoenergetic Positron Beam at the Reactor Based Positron Source at FRM-II. Nuclear Instruments and Methods in Physics Research B 192 (2002), 97-101.
  • Hugenschmidt, C., Schreckenbach, K., Repper, R., Kögel, G.: The In-Pile Positron Source at the Munich Research Reactor FRM-II. Kerntechnik (2002), 519-522.
  • Kögel, G.: Microscopes/Microprobes. Applied Surface Science 194 (2002), 200-209.

2001

  • Britton, D.T., Barthe, M.-F., Corbel, C., Hempel, A., Henry, L., Desgardin, P., Bauer-Kugelmann, W., Kögel, G., Sperr, P., Triftshäuser, W.: Evidence for Negatively Charged Vacancy Defects in 6H-SiC after Low-Energy Proton Implantation. Applied Physics Letters 78 (2001), 1234-1236.
  • Slugen, V., Kögel, G., Sperr, P., Triftshäuser, W.: Pulsed Positron Beam Investigation of Reactor Steels. Journal of Electrical Engineering 52 (2001), 88-91.
  • Kawasuso, A., Redmann, F., Krause-Rehberg, R., Weidner, M., Frank, T., Pensl, G.; Sperr, P., Itoh, H., Triftshäuser, W.: Annealing Behaviour of Vacancies and Z1/2 Levels in Electron-Irradiated 4H-SiC Studied by Positron Annihilation and Deep-Level Transient Spectroscopy. Applied Physics Letters 79 (2001), 3950-3952.
  • Britton, D.T., Hempel, A., Triftshäuser, W.: Hopping Transport of Positrons in Hydrogenated Amorphous Silicon. Physical Review Letters 87 (2001), 217401-217404.
  • Slugen, V., Hascik, J., Grone, R., Bartik, P., Zeman, A., Kögel, G., Sperr, P., Triftshäuser, W.: Investigations of Reactor Steels. Materials Science Forum 363-365 (2001), 47-51.
  • Kawasuso, A., Redmann, F., Krause-Rehberg, R., Frank, T., Weidner, M., Pensl, G., Sperr, P., Itoh, H.: Vacancies and deep levels in electron-irradiated 6H SiC epilayers studied by positron annihilation and deep level transient spectroscopy. Journal of Applied Physics, 90, No. 7 (2001), 3377.
  • Hugenschmidt, C., Kögel, G., Schreckenbach, K., Sperr, P., Strasser, B., Triftshäuser, W.: Intense Positron Source at the Munich Research Reactor FRM-II. Materials Science Forum 363-365 (2001), 425-429.
  • Britton, D.T., Gxawu, D., Hempel, A., Barthe, M.-F., Henry, L., Desgardin, P., Corbel, C., Bauer-Kugelmann, W., Sperr, P., Kögel, G., Triftshäuser, W.: Pulsed Positron Beam Study of as-grown Defects in Epitaxial SiC. Materials Science Forum 363-365 (2001), 460-462.
  • De Baerdemaeker, J., Van Hoecke, T., Van Petegem, S., Segers, D., Bauer-Kugelmann, W., Sperr, P., Terwagne, G.: Investigation of Stainless Steel Films Sputtered on Glass. Materials Science Forum 363-365 (2001), 496-498.
  • Hempel, A., Dabrowski, A., Härting, M., Hempel, M., Knoesen, D., Bauer-Kugelmann, W., Kögel, G., Britton, D.T., Triftshäuser, W.: Annealing Effects in Hydrogenated Amorphous Silicon Layers. Materials Science Forum 363-365 (2001), 463-465.
  • Bauer-Kugelmann, W., Sperr, P., Kögel, G., Triftshäuser, W.: Latest Version of the Munich Pulsed Low Energy Positron System. Materials Science Forum 363-365 (2001), 529-531.
  • Kawasuso, A., Redmann, F., Krause-Rehberg, R., Sperr, P., Frank, T., Weidn er, M., Pensl, G., Itoh, H.: Annealing Process of Defects in Epitaxial SiC Induced by He and Electron. Materials Science Forum 353-356 (2001), 537-542.
  • Sperr, P., Kögel, G., Bauer-Kugelmann, W., Triftshäuser, W., Fujinami, M.: "Smart Cut" Silicon by Proton Implantation: Lifetime Studies with a Pulsed Positron Beam. Materials Science Forum 363-365 (2001), 532-536.
  • Hempel, A., Hempel, M., Härting, M., Britton, D.T., Bauer-Kugelmann, W., Triftshäuser, W.: Defect Studies of Diamond Hard Coatings. Radiation Effects and Defects in Solids 156 (2001), 215-220.
  • Britton, D.T., Hempel, A., Härting, M., Kögel, G., Sperr, P., Triftshäuser, W., Arendse, C., Knoesen, D.: Annealing and Recrystallization of Hydrogenated Amorphous Silicon. Physical Review B 64 (2001), 075403/1-8.
  • Krause-Rehberg, R., Börner, F., Redmann, F., Gebauer, J., Kogler, R., Kliemann, R., Skorupa, W., Egger, W., Kögel, G., Triftshäuser, W.: Identification of Getter Defects in High-Energy Self-Implanted Silicon at Rp /2. Physica B 308-310 (2001), 442-445.
  • Barthe, M.-F., Britton, D.T., Corbel, C., Hempel, A., Henry, L., Desgardin, P., Bauer-Kugelmann, W., Kögel, G., Sperr, P., Triftshäuser, W.: Negatively Charged Vacancy Defects in 6H-SiC after Low-Energy Proton Implantation and Annealing. Physica B 308-310 (2001), 668-670.
  • David, A., Kögel, G., Sperr, P., Triftshäuser, W.: Lifetime Measurements with a Scanning Positron Microscope. Physical Review Letters 87 (2001), 067402.

2000

  • Britton, D.T., Hempel, A., Knoesen, D., Bauer-Kugelmann, W., Triftshäuser, W.: Structural Characterisation of Hydrogenated a-Si Using Slow Positron Beam Techniques. Nuclear Instruments and Methods in Physics Research B 164-165 (2000), 1010-1015.
  • Triftshäuser, W.: Positron Annihilation in Near-Surface Regions and Layered Structures. Vacuum 58 (2000), 33-44.

1999

  • Sperr, P. and Maier, M.R.: A Variable Nanosecond Delay for Fast Signals. Nuclear Instruments and Methods in Physics Research A 431 (1999), 234.
  • Osipowicz, A., Härting, M., Hempel, M., Britton, D.T., Bauer-Kugelmann, W.,Triftshäuser, W.: Characterisation of RF-Sputtered Platinum Films from Industrial Production Plants Using Slow Positrons. Applied Surface Science 149 (1999), 198-203.
  • Hugenschmidt C., Kögel, G., Schreckenbach, K., Sperr, P., Springer, M., Straßer, B., Triftshäuser, W.: High Intense Positron Beam at the New Munich Research Reactor FRM-II. Applied Surface Science 149 (1999), 7-10.

 

Ion related publications:

 

  1. STRUCTURE STUDIES OF CARBON FOILS WITH THE AIM TO IMPROVE THE ABILITY FOR HEAVY ION STRIPPING G. Dollinger and P. Maier-Komor, Nucl. Instr. and Meth. A257 (1987) 64.

  2. HEAVY ION IRRADIATION DAMAGE IN CARBON STRIPPER FOILS G. Dollinger and P. Maier-Komor, Nucl. Instr. and Meth. A282 (1989) 223.

  3. STRIPPER FOIL REQUIREMENTS FOR OPTIMUM ION TRANSMISSION AT THE MUNICH MP-TANDEM G. Dollinger and P. Maier-Komor, Nucl. Instr. and Meth. A282 (1989) 153.

  4. IRRADIATION DAMAGE IN CARBON STRIPPER FOILS INDUCED BY HEAVY IONS G. Dollinger and P. Maier-Komor, Rad. Effects and Defects in Solids 110 (1989) 197.

  5. FINAL RESULTS IN STRIPPER FOIL DEVELOPMENT G. Dollinger and P. Maier-Komor, Proc. SNEAP 1989, Oak Ridge (World Scientific, New Jersey, 1990) p. 138.

  6. OPTIMUM STRENGTH AGAINST IRRADIATION DAMAGE OF ISOTROPIC CARBON STRIPPER FOILS G. Dollinger and P. Maier-Komor, Nucl. Instr. and Meth. B53 (1991) 352.

  7. STRUCTURE INVESTIGATIONS OF THIN CARBON FOILS G. Dollinger and P. Maier-Komor and A. Mitwalski, Nucl. Instr. and Meth. A303 (1991) 79-87.

  8. DEVELOPMENT OF LASER PLASMA ABLATION-DEPOSITION TECH-NIQUES FOR CARBON STRIPPER FOILS G. Dollinger and P. Maier-Komor, Nucl. Instr. and Meth. A303 (1991) 50-58.

  9. THICKNESS CALIBRATION OF CARBON FOILS P. Maier-Komor, G. Dollinger und E. Hammann, Nucl. Instr. and Meth. A303 (1991) 88-93.

  10. PROGRESS IN TARGET TECHNOLOGY USING A PULSED LASER BEAM FOR EVAPORATION-CONDENSATION PROCESSES P. Maier-Komor, G. Dollinger, Nucl. Instr. and Meth. A303 (1991) 168-171.

  11. HIGH RESOLUTION DEPTH PROFILING OF LIGHT ELEMENTS G. Dollinger, T. Faestermann und P. Maier-Komor, Nucl. Instr. and Meth. B64 (1992) 422-427.

  12. ELASTIC RECOIL DETECTION ANALYSIS WITH ATOMIC DEPTH RESOLUTION G. Dollinger, Nucl. Instr. and Meth. B79 (1993) 513-517.

  13. NEW PLANT FOR FABRICATING CARBON STRIPPER FOILS BY LASER PLASMA ABLATION DEPOSITION PROCESS G. Dollinger, P. Maier-Komor, C.M. Frey, E.Hamman und H.J. Körner, Nucl. Instr. and Meth. A328 (1993) 168-172.

  14. DEPTH MICROSCOPY FOR THIN FILM ANALYSIS G. Dollinger, M. Boulouednine, T. Faestermann und P. Maier-Komor, Nucl. Instr. and Meth. A334 (1993) 187-190.

  15. LASER PLASMA ABLATION OF CARBON G. Dollinger, C.M. Frey und P. Maier-Komor, Nucl. Instr. and Meth. A334 (1993)172.

  16. DEPTH MICROSCOPY AT INTERFACES G. Dollinger, T. Faestermann, C.M. Frey, A. Bergmaier, E. Schwabedissen, Th. Fischer, R. Schwarz, Nucl. Instr. and Meth. B 85 (1994) 786.

  17. CALCIUM TARGETS WITH LOW HYDROGEN CONTENT G. Dollinger, T. Faestermann, C.M. Frey, P. Maier-Komor, Nucl. Instr. and Meth. A 362 (1995) 60.

  18. ELEMENTAL COMPOSITION OF THIN CUBIC BORON NITRIDE LAYERS A. Bergmaier, G. Dollinger, T. Faestermann, C.M. Frey, W. Dworschak und H. Ehrhardt, Diamond and Related Materials 4 (1995) 478.

  19. IMPURITIES OF LIGHT ELEMENTS IN CVD-DIAMOND G. Dollinger, A. Bergmaier, C.M. Frey, M. Roesler und H. Verheuven, Diamond and Related Materials 4 (1995) 591.

  20. HIGH RESOLUTION DEPTH PROFILING BY ELASTIC RECOIL DETECTION WITH HEAVY IONS G. Dollinger, A. Bergmaier, T. Faestermann und C.M. Frey, Fres. J. Anal. Chem. 353 (1995) 311.

  21. QUANTITATIVE ELASTIC RECOIL DETECTION A. Bergmaier, G. Dollinger, Fres. J. Anal. Chem. 353 (1995) 582.

  22. CHARGE STATE DEPENDENCE OF THE STOPPING POWER OF 1 MeV/A 58Ni-IONS IN THIN CARBON FOILS C.M. Frey, G. Dollinger, A. Bergmaier, T. Faestermann, P. Maier-Komor, Nucl. Instr. and Meth. B 99 (1995) 205.

  23. QUANTITATIVE ELASTIC RECOIL DETECTION A. Bergmaier, G. Dollinger, C.M. Frey, Nucl. Instr. and Meth. B 99 (1995) 488.

  24. COMPLETION OF THE PLANT FOR LASER PLASMA ABLATION-DEPOSITION OF CARBON P. Maier-Komor, G. Dollinger, C.M. Frey, H.J. Körner, Nucl. Instr. and Meth. A 362 (1995) 208.

  25. CHARGE STATE DEPENDENCE OF THE STOPPING POWER OF 1 MeV/A 58Ni-IONS C.M. Frey, G. Dollinger, A. Bergmaier, T. Faestermann, P.Maier-Komor, Nucl. Instr. and Meth, B 107 (1996) 31.

  26. IMPACT AND CHARACTERISATION OF HEAVY ION TRACKS ON EPITAXIAL GROWTH F. Baudenbacher, G. Dollinger, F. Ohnesorge, M. Bauer, W. Assmann, H. Kinder, Nucl. Instr. and Meth. B 107 (1996) 327.

  27. ERDA WITH VERY HEAVY ION BEAMS W. Assmann, J.A. Davies, G. Dollinger, S. Forster, H. Huber, R. Siegele, Nucl. Instr. and Meth. B 118 (1996) 242

  28. LIMITS IN ELASTIC RECOIL DETECTION ANALYSIS WITH HEAVY IONS G. Dollinger, M. Boulouednine, A. Bergmaier, T. Faestermann, C.M. Frey, Nucl Instr. and Meth. B 118 (1996) 291.

  29. DETECTION OF NITROGEN IN CVD DIAMOND A. Bergmaier, G. Dollinger, T. Faestermann, C.M. Frey, M. Ferguson, H. Güttler, Diamond and Rel. Mat. 5 (1996) 995.

  30. THE EFFECT OF HYDROGEN ON THE NUCLEATION AND GROWTH OF c-BN M. Kuhr, R. Freudenstein, S. Reinke W. Kulisch, G. Dollinger, A. Bergmaier, J. Chem. Vap. Dep. 3 (1996) 259.

  31. CODEPOSITION OF HYDROGEN WITH BERYLLIUM, CARBON AND TUNGSTEN M. Mayer, R. Behrisch, H. Plank, J. Roth, G. Dollinger, C. M. Frey, J. Nucl. Mat. 230 (1996) 67

  32. HYDROGEN INCORPORATION DURING NUCLEATION AND GROWTH OF c-BN FILMS M. Kuhr, R. Freudenstein, S. Reinke, W. Kuhlisch, G. Dollinger, A. Bergmaier, Diamond and Rel. Mat. 5 (1996) 984.

  33. THERMAL STABILITY AND DESORPTION OF GROUP III NITRIDES PREPARED BY MOCVD O. Ambacher, M.S. Brandt, R. Dimitrov, G. Dollinger, A. Bergmaier, R. Fischer, A. Miehr, T. Metzger, M. Stutzmann, J. Vac. Sci. Technol. B 14 (1996) 3532.

  34. HYDROGEN IN GALLIUM NITRIDE GROWN BY MOCVD O. Ambacher, H. Angerer, A. Bergmaier, R. Dimitrov, G. Dollinger, W. Rieger, M. Stutzmann., phys. stat. sol. 159 (1997) 105.

  35. DESIGN OF THE NEW SUPERCONDUCTING MICROPROBE SYSTEM IN MUNICH G. Hinderer, G. Dollinger, G. Datzmann, H.J. Körner, Nucl. Instr. and Meth. B130 (1997) 51.

  36. THERMAL STABILITY OF GROUP III-NITRIDES GROWN BY MOCVD O. Ambacher, A. Bergmaier, M.S. Brandt, R. Dimitrov, G. Dollinger, R.A. Fischer, A. Miehr, T. Metzger and M. Stutzmann, 23rd Internat. Conf. on The Physics of Semiconductors 1 (1996) 561.

  37. ENERGY STRAGGLING OF 60 MEV 58NIQ+ IONS IN THIN CARBON FOILS AND GASES O. Schmelmer, G. Dollinger, C.M. Frey, A. Bergmaier, S. Karsch, Nucl. Instr. and Meth. B 145 (1998) 261.

  38. MONOLAYERS OF GRAPHITE RESOLVED BY ELASTIC RECOIL DETECTION G. Dollinger, C. M. Frey, A. Bergmaier, T. Faestermann, Europhys. Lett. 42 (1998) 25.

  39. CHARACTERISATION OF AlxGa1-xN FILMS PREPARED BY PLASMA-INDUCED MOLECULAR-BEAM EPITAXY ON C-PLANE SAPPHIRE H. Angerer, O. Ambacher, M. Stutzmann, T. Metzger, R. Höpler, E. Born, A. Bergmaier G. Dollinger, Appl. Phys. Lett. 71 (1997) 1504 - 1506.

  40. THE NUCLEATION AND GROWTH OF LARGE AREA, HIGHLY ORIENTED DIAMOND FILMS ON SILICON SUBSTRATES A. Flöter, H. Güttler, G. Schulz, D. Steinbach, C. Lutz-Elsner, R. Zachai, A. Bergmaier, G. Dollinger, Diam. Rel. Mater., 7 (1998) 283 - 288.

  41. GRADIENT INTERFACE LAYERS TO IMPROVE c-BN THIN FILM ADHESION Freudenstein R., S. Reinke, W. Kulisch, R. Fischer, J. Zweck, A. Bergmaier, G. Dollinger, Mater. Sci. Forum 287 (1998) 259.

  42. MICROSCOPIC STRUCTURAL QUALITY OF LARGE AREA HIGHLY ORIENTED DIAMOND ON SILICON SUBSTRATES FOR ACTIVE ELECTRONIC APPLICATIONS D. Steinbach, A. Flöter H. Güttler R. Zachai, A. Bergmaier, G. Dollinger, Proceedings of ECS meeting; Pennington, USA (1998) 521.

  43. PHASE SEPARATION IN MAGNETRON SPUTTERED SUPERHARD BCN THIN FILMS S. Ulrich, H. Ehrhardt, T. Theel, J. Schwan, S. Westermeyr, M. Scheib, P. Becker, G. Dollinger, A. Bergmaier, Diam. Rel. Mater., 7 (1998) 839 - 844.

  44. IMPURITY AND DEFECT INCORPORATION IN DIAMOND FILMS DEPOSITED AT LOW SUBSTRATE TEMPERATURES J. Stiegler, A. Bergmaier, J. Michler, Y. von Kaenel, G. Dollinger, E. Blank, Diam. Rel. Mater., 7 (1998) 193 - 199.

  45. MODIFICATION OF DIAMOND FILM GROWTH BY A NEGATIVE BIAS VOLTAGE IN MICROWAVE PLASMA CHEMICAL VAPOUR DEPOSITION M. Schreck, T. Baur, B. Stritzker, A. Bergmaier, G. Dollinger, Diam. Rel. Mater., 7 (1998) 293 - 298.

  46. A COMPACT ΔE-ERES DETECTOR FOR ELASTIC RECOIL DETECTION WITH HIGH SENSITIVITY A. Bergmaier, G. Dollinger, C.M. Frey, Nucl. Instr. Meth. B 136 - 138 (1998) 638.

  47. NONEQUILIBRIUM CHARGE STATES OF RECOIL IONS IN HIGH RESOLUTION ELASTIC RECOIL DETECTION ANALYSIS G. Dollinger, M. Boulouednine, A. Bergmaier, T. Faestermann, Nucl. Instr. and Meth. B 136 - 138 (1998) 574.

  48. ELASTIC RECOIL DETECTION WITH SINGLE ATOMIC LAYER DEPTH RESOLUTION G. Dollinger, C.M. Frey, A. Bergmaier, T. Faestermann, Nucl. Instr. and Meth. B 136 -138 (1998) 603.

  49. DIAMOND GROWTH WITH BORON ADDITION P. Hartmann, S. Bohr, R. Haubner, B. Lux, P. Wurzinger, M. Griesser, A. Bergmaier, G. Dollinger, H. Sternschulte, R. Sauer, Int. J. Refr. Met. Hard Mat. 16 (1998) 223.

  50. IMPROVEMENT OF THE PREPARATION PROCEDURE OF CARBON STRIPPER FOILS FROM THE LASER PLASMA ABLATION-DEPOSITION PROCESS P. Maier-Komor, A. Bergmaier, G. Dollinger, C.M. Frey, H.-J. Körner, Nucl. Instr. and Meth. A 397 (1997) 131.

  51. AN UHV BOX COATER FOR VUV REFLECTIVE COATINGS ON MIRROR SUBSTRATES OF UP TO 95 CM IN DIAMETER P. Maier-Komor, A. Bergmaier, G. Dollinger, J. Friese, S. Karsch, P. Kienle, H.-J. Körner, Nucl. Instr. and Meth. A 397 (1997) 194.

  52. DETERMINATION OF THE AL MOLE FRACTION AND THE BAND GAP BOWING OF EPITAXIAL AlxGa1-xN FILMS H. Angerer, D. Brunner, F. Freudenberg, O. Ambacher, M. Stutzmann, R. Höpler, T. Metzger, E. Born, G. Dollinger, A. Bergmaier, S. Karsch, H.J. Körner, Appl. Phys. Lett. 71 (1997) 1504 - 1506.

  53. ELEMENTAL ANALYSIS ON GROUP-III NITRIDES USING HEAVY ION ERD G. Dollinger, S. Karsch, O. Ambacher, H. Angerer, A. Bergmaier, O. Schmelmer, M. Stutzmann, Mat. Res. Soc. Symp. Proc. 482 (1998) 745.

  54. THE NUCLEATION AND GROWTH OF LARGE AREA; HIGHLY ORIENTED DIAMOND FILMS ON SILICON SUBSTRATES A. Flöter, H. Güttler, G. Schulz, D. Steinbach, C. Lutz-Elsner, R. Zachai, A. Bergmaier, G. Dollinger, Diam. Rel. Mat. 7 (1998) 283.

  55. EXCITED STATE POPULATION EFFECT OF 60 MEV 58NI IONS PENETRATING THIN CARBON FOILS O. Schmelmer, G. Dollinger, C.M. Frey, A. Bergmaier and S. Karsch, Nucl Instr. and Meth. B 142 (1998) 210.

  56. HIGH PRESSURE FABRICATION AND PROCESSING OF GaN:Mg T. Suski, J. Jun, M. Leszcznynski, H. Teisseyre, I. Grzegory, S. Porowski, G. Dollinger, K. Saarinen, T. Laine, J. Nissilä, W. Burkhard, W. Kriegseis, B.K. Meyer, Materials Sci. and Engineering B59, 1-5 (1999).

  57. ACCEPTOR DEPLETION IN P-TYPE POROUS SILICON G. Polisski, G. Dollinger, A. Bergmaier, D. Kovalev, H. Heckler, F. Koch, phys. stat. sol. 168 (1998) R1.

  58. OPTICAL AND ELECTRONIC STRUCTURE STUDIES OF GALLIUM NITRIDE SINGLE CRYSTALS T. Suski, H. Teisseyre, I. Grzegory, S. Porowski, O. Ambacher, L. Wittmer, T. Wethkamp, G. Dollinger, Proc. 24th ICPS, Jerusalem, 1998.

  59. OXYGEN AT THE INTERFACE OF CVD DIAMOND FILMS ON SILICON A. Bergmaier, M. Schreck, G. Dollinger, O. Schmelmer, K.-H. Thürer, B. Stritzker, Diam. Rel. Mat. 8 (1999) 1142.

  60. ELECTRON STIMULATED DESORPTION ON DIAMOND (100) AS A NEGATIVE HYDROGEN SOURCE C.Goeden, G. Dollinger, Appl. Surf. Science 147 (1999) 107.

  61. THE SUPERCONDUCTING MULTIPOLE LENS FOR FOCUSING HIGH ENERGY IONS G. Datzmann, G. Dollinger, G. Hinderer†, H.-J. Körner, Nucl. Instr. and Meth. B158 (1999) 74.

  62. A NOVEL HIGH PRECISION SLIT SYSTEM O.Schmelmer, G.Dollinger, G.Datzmann, C.Goeden and H.-J.Körner, Nucl. Instr. and Meth. B158 (1999) 107.

  63. IMPURITY AND DEFECT INCORPORATION IN DIAMOND FILMS DEPOSITED AT LOW SUBSTRATE TEMPERATURES J. Stiegler, A. Bergmaier, J. Michler, Y. von Kaenel, G. Dollinger, E. Blank, Diam. Rel. Mat., 7 (1998) 193

  64. STRUCTURAL RESPONSE AND STRESS RELEASE OF HEXAGONAL AND CUBIC BORON NITRIDE FILMS DUE TO THE BOMBARDMENT WITH 170 MEV IODINE IONS P. Widmayer, D. Schwertberger, M.J. Wenig, P. Ziemann, A. Bergmaier, G. Dollinger, Diam. Rel. Mat. 7 (1998) 1503.

  65. CHARGE DEPENDENT ENERGY LOSS OF 60 MEV NI IONS IN ARGON GAS O. Schmelmer, G. Dollinger, C.M. Frey, A. Bergmaier, S. Karsch, Nucl. Instr. and Meth. B 146 (1998) 95.

  66. δ-DOPING IN DIAMOND M. Kunze, A. Vescan, G. Dollinger, A. Bergmaier, E. Kohn, Carbon 37 (1999) 787.

  67. CONTROL OF LITHIUM-T-BUTOXIDE ADDITION DURING CHEMICAL VAPOUR DEPOSITION OF LI-DOPED DIAMOND FILMS BY OPTICAL EMISSION SPECTROSCOPY H. Sternschulte, M. Schreck, B. Stritzker, A. Bergmaier, G. Dollinger, phys. stat. sol. (a) 174 (1999) 65.

  68. DIAMOND JUNCTION FETs BASED ON δ-DOPED CHANNELS A. Aleksov, A. Vescan, M. Kunze, P. Gluche, W. Ebert, E. Kohn, A. Bergmaier, G. Dollinger, Diam. Rel. Mat. 8 (1999) 941.

  69. COMPOSITION ANALYSIS USING ELASTIC RECOIL DETECTION L. Görgens, G. Dollinger, A. Bergmaier, O. Ambacher, L. Eastman, J. A. Smart, J. F. Shealy, R. Dimitrov, M. Stutzmann, A. Mitchell, phys. stat. sol. (b) 216, 679 (1999).

  70. HIGH RESOLUTION DEPTH PROFILING OF LIGHT ELEMENTS IN SILICON NANOSTRUCTURES UTILIZING ELASTIC RECOIL DETECTION (ERD) G. Dollinger, V. Petrova-Koch, I. Eisele, Proc Nano-El ´98, Munich, (1998) A4-1.

  71. BIAS ENHANCED NUCLEATION AND GROWTH OF DIAMOND FILMS ON TITANIUM SUBSTRATES R. Fehling; M. Schreck; A. Bergmaier; G. Dollinger; B. Stritzker: Mat. Sci. For.287-288; (1998) 315.

  72. CHARACTERISATION OF ULTRA THIN OXYNITRIDES; A GENERAL APPROACH B. Brijs, J. Deleu, T. Conard, H. de Witte, W. Vandervorst, K. Nakajima, K. Kimura, I. Genchev, A. Bergmaier, L. Goergens, P. Neumaier, G. Dollinger, M. Döbeli, Nucl. Instr. and Meth. B 161 – 163 (2000) 429.

  73. ELECTRON STIMULATED DESORPTION OF NEGATIVE HYDROGEN IONS FROM DIAMOND (100) C. Goeden, G. Dollinger, P. Feulner, Diam. and Rel. Mat., 9 (2000) 1164.

  74. QUANTITATIVE ANALYSIS OF DEUTERIUM IN AMORPHOUS A-C:D LAYERS; A ROUND ROBIN EXPERIMENT R. Behrisch, M. Mayer, W. Jacob, W. Assmann, G. Dollinger, A. Bergmaier, U. Kreissig, M. Friedrich, G.Y. Sun, D. Hildebrandt, M. Akbi, W. Schneider, D. Schleußner, W. Knapp, Ch. Edelmann, J. Nucl. Mat., 281 (2000) 42.

  75. REPRODUCIBILITY AND SIMPLIFICATION OF THE PREPARATION PROCEDURE FOR CARBON STRIPPER FOILS BY LASER PLASMA ABLATION DEPOSITION P.Maier-Komor, G. Dollinger, H.-J- Körner, Nucl. Instr. and Meth. A 438 (1999) 73.

  76. THE FORMATION OF SILICON (111) BORON SURFACE PHASES AND THEIR INFLUENCE ON THE EPITAXIAL GROWTH OF SILICON AND GERMANIUM J. Schulze, H. Baumgärtner, C. Fink, G. Dollinger, I. Genchev, L. Görgens, W. Hansch, H.E. Hoster, T.H. Metzger, R. Paniagio, T. Stimpel, T. Sulima, I. Eisele, Thin Solid Films, 369 (2000) 10.

  77. LITHIUM ADDITION DURING CVD-DIAMOND GROWTH: INFLUENCE OF THE OPTICAL EMISSION OF THE PLASMA AND PROPERTIES OF THE FILMS H. Sternschulte, M. Schreck, B. Stritzker, A. Bergmaier, G. Dollinger, Diam. Rel. Mat., 9 (2000) 1046.

  78. ANISOTROPY OF THE ELECTRON MOMENTUM DENSITY OF GRAPHITE STUDIED BY (γ,eγ) AND (e,2e) SPECTROSCOPY T. Sattler, Th. Tschentscher, J.R. Schneider, M. Vos, A.S. Keitfets, D.R. Lun, E. Weigold, G. Dollinger, H. Bross, F. Bell, Phys. Rev. B 63 (2001) 1.

  79. COMPOSITION, NANOSTRUCTURE AND ORIGIN OF THE ULTRAHARDNESS IN nc-TiN/a-Si3N4/a- & nc-TiSi2 NANOCOMPOSITES WITH HV= 80 TO 100 GPa S. Veprek*a, A. Niederhofera, K. Motoa, T. Boloma, H. Männlinga, P. Nesladeka, G. Dollinger, A. Bergmaier, Surf. Coat. Techn. 133-134 (2000) 152.

  80. EPITAXIAL CaGe2 FILMS ON GERMANIUM G. Vogg, M.S. Brandt, M. Stutzmann, I. Genchev, A. Bergmaier, L. Görgens, G. Dollinger, J. Crystal Growth 212 (2000) 148.

  81. THE EFFECT OF NITROGEN ON LOW TEMPERATURE GROWTH OF DIAMOND FILMS J. Stiegler; A. Bergmaier; J. Michler; S. Laufer; G. Dollinger; E. Blank, Thin Solid Films 352 (1999) 29.

  82. BORON IN MESOPOROUS SI - WHERE HAVE ALL THE CARRIERS GONE? : G. Polisski; D. Kovalev; G. Dollinger; T. Sulima; F. Koch, Physica-B. 273-274 (1999) 951.

  83. HIGH RESOLUTION ELASTIC RECOIL DETECTION UTILISING BAYESIAN PROBABILILITY THEORY P. Neumaier, G. Dollinger, A. Bergmaier, I. Genchev, L. Goergens, R. Fischer, C. Ronning, H. Hofsäss, Nucl. Instr. and Meth. B 183 (2001) 48.

  84. PARTICLE-INDUCED X-RAY EMISSION USING HIGH ENERGY IONS WITH RESPECT TO MICROPROBE APPLICATION, O. Schmelmer, G. Dollinger, G. Datzmann, A. Hauptner, H. J. Körner, P. Maier-Komor and P. Reichart, Nucl. Instr. and Meth. B, 179 (2001) 469-479.

  85. THE MUNICH MICROPROBE SNAKE: FIRST RESULTS USING 20 MEV PROTONS AND 90 MEV SULFUR IONS G. Datzmann, G. Dollinger, C. Goeden, A. Hauptner, H.-J. Körner, P. Reichart, O. Schmelmer, Nucl. Instr. and Meth. B 181 (2001) 20.

  86. ELECTRON STIMULATED DESORPTION OF NEGATIVE HYDROGEN IONS FROM DIAMOND (100) C. Goeden, G. Dollinger, P. Feulner, Diam. and Rel. Mat., 9 (2000) 1164.

  87. NITROGEN IMPLANTATIONS FOR RAPID THERMAL OXINITRIDE LAYERS, A. Stadler, I. Genchev, A. Bergmaier, G. Dollinger, V. Petrova-Koch, W. Hansch, H. Baumgärtner and I. Eisele, Microelectronics Reliability 41 (2001) 977-980

  88. SENSITIVE 3D HYDROGEN MICROSCOPY BY PROTON-PROTON SCATTERING P. Reichart, G. Dollinger, G. Datzmann, A. Hauptner, H.-J. Körner, O. Schmelmer, Nucl. Instr. and Meth. B197 (2002) 134.

  89. NANOPROBE CAPABILITIES USING 25 MEV PROTONS OR 200 MEV HEAVY IONS G. Datzmann, G. Dollinger, C. Goeden, H.J. Körner, O. Schmelmer, Rad. Res. 153 (2000) 220.

  90. DEVELOPMENT OF ANTIREFLECTION COATINGS (ARC) WITH A 6LiF/ 62Ni MULTILAYER CONVERTER FOR ULTRACOLD NEUTRON (UCN) DETECTORS P. Maier-Komor, I. Altarev, A. Bergmaier, G. Dollinger, S. Paul, W. Schott, Nucl. Instr. and Meth. A, 480 (2002) 104.

  91. DEUTERIUM DEPTH PROFILES AT CVD DIAMOND SURFACES, A. Bergmaier, G. Dollinger, A. Aleksov, P. Gluche and E. Kohn, Surface Science, 481 (2001) L433-L436.

  92. ELECTRICAL ACTIVITY OF B AND AS SEGREGATED AT THE SI-SIO2 INTERFACE J. Frühauf, R. Lindsay, A. Bergmaier, W. Vandervorst, G. Tempel, K. Maex, G. Dollinger, F. Koch, Mat. Res. Soc. Symp. Proc. C3.4 (2002) 717.

  93. HYDROGEN RESPONSE MECHANISM OF Pt-GaN SCHOTTKY DIODES J. Schalwig, G. Müller, U. Karrer, M. Eickhoff, O. Ambacher, M. Stutzmann, L. Görgens, G. Dollinger, Appl. Phys. Lett. 80 (2002) 1222.

  94. ELECTRON STIMULATED DESORPTION OF NEAGTIVE IONS: A TIME OF FLIGHT EXPERIMENT C. Goeden and G. Dollinger, Rev. Scientific Instruments 73 (2002) 3058.

  95. ION BEAM ANALYSIS OF ALUMINIUM IN THIN LAYERS M.J.F. Healy, A.J. Pidduck, G. Dollinger, L. Görgens, A. Bergmaier, Nucl. Instr. and Meth. B 190 (2002) 630.

  96. ADVANCED CHARACTERIZATION OF HIGH-K MATERIALS: A NUCLEAR APPROACH B. Brijs, C. Huyghebaert, S. Nauwelaerts, M. Caymax, W. Vandervorst, K. Nakajima, K. Kimura, A. Bergmaier, G. Dollinger, W.N. Lennard, G. Terwagne, A. Vantomme, Nucl. Instr. and Meth. B 190 (2002) 505.

  97. ANALYSIS OF THE TOTAL CARBON DEPOSITION DURING THE BIAS ENHANCED NUCLEATION OF DIAMOND ON Ir/SrTiO3 (001) USING 13C-METHANE Th. Bauer, M. Schreck, , F. Hörmann, A. Bergmaier, G. Dollinger, B. Stritzker, Diam. Relat. Mater. 11 (2002) 493.

  98. DEPENDENCE OF THE DOPING EFFICIENCY ON MATERIAL COMPOSITION IN n-TYPE a-SiOx:H A. Janotta, R. Janssen, M. Schmidt, T. Graf, L. Görgens, C. Hammerl, S. Schreiber, G. Dollinger, A. Bergmaier, B. Stritzker, M. Stutzmann, J. Non-Crystal. Solids 299 – 302 (2002) 579.

  99. AN ULTRACOLD NEUTRON (UCN) DETECTOR WITH Ti/6LiF MULTI-LAYER CONVERTER AND 58Ni REFLECTOR P. Maier-Komor, I. Altarev, A. Bergmaier, G. Dollinger, S. Paul, G. Petzoldt, W. Schott, Nucl. Instr. and Meth. A 480 (2002) 109.

  100. ELECTRON-STIMULATED HYDROGEN DESORPTION FROM DIAMOND SURFACES AND ITS INFLUENCE ON THE LOW-PRESSURE SYNTHESIS OF DIAMOND C. Goeden, G. Dollinger, Appl. Phys. Lett. 81 (2002) 5027.

  101. THREE-DIMENSIONAL HYDROGEN MICROSCOPY USING A HIGH-ENERGY PROTON PROBE G. Dollinger, P. Reichart, G. Datzmann, A. Hauptner, H.-J. Körner, Appl. Phys. Lett. 82 (2003) 148.

  102. THE MUNICH ION MICROPROBE: CHARACTERISTICS AND PROSPECTS G. Dollinger, G. Datzmann, A. Hauptner, R. Hertenberger, H.-J. Körner, P. Reichart, B. Volckaerts, Nucl. Instr. and Meth. B 210 (2003) 6.

  103. SENSITIVE 3D HYDROGEN MICROSCOPY USING HIGH ENERGY PROTONS AT SNAKE P. Reichart, G. Dollinger, G. Datzmann, A. Hauptner, R. Hertenberger, H.-J. Körner, Nucl. Instr. and Meth. B 210 (2003) 135.

  104. DIAMOND DIODES AND TRANSISTORS A. Aleksov, A. Denisenko, M. Kunze, A. Vescan, A. Bergmaier, G. Dollinger, W. Ebert, E. Kohn, Semicond. Sci. Technol. 18 (2003) 59.

  105. CHARACTERIZATION OF THE B AND As PILE-UP AT THE Si-SiO2 INTERFACE J. Frühauf, R. Lindsay, A. Bergmaier, G. Dollinger, W. Vandervorst, K. Maex, Frederick Koch, Proc. USJ-2003, accepted for publication.

  106. CHARACTERIZATION OF THE B AND As PILE-UP AT THE Si-SiO2 INTERFACE J. Frühauf, R. Lindsay, A. Bergmaier, G. Dollinger, W. Vandervorst, K. Maex, Frederick Koch, J. Vac. Sci. Tech. B, submitted

  107. PHYSICAL CHARACTERISATION OF THIN ALD-AL2O3 FILMS S. Jakschik, U. Schroeder, T. Hecht, D. Krueger, G. Dollinger, A. Bergmaier, C. Luhmann, J. Bartha, Appl. Surf. Sci. 211 (2003) 352 – 359

  108. AN (UN)SOLVABLE PROBLEM IN SIMS: B-INTERFACIAL PROFILING W. Vandervorst; T. Janssens; R. Loo; M. Caymax; I. Peytier; R. Lindsay; J. Fruhauf; A. Bergmaier; G. Dollinger., Appl. Surf. Sci. 203-204 (2003) 371.

  109. PHYSICAL CHARACTERISATION OF THIN HFO2 LAYERS BY THE COMBINED ANALYSIS WITH COMPLEMENTARY TECHNIQUES H. Bender Th. Conard, O. Richard, B. Brijs, J. Pétry, W. Vandervorst, Chr. Defranoux, P. Boher, N. Rochat, C. Wyon, P. Mack, J. Wolstenholme, R. Vitchev, L. Houssiau, J.-J. Pireaux, A. Bergmaier, G. Dollinger, Proc. Anal. Techn. For Semiconductor Mat. and process characterisation IV- ALTECH2003, Electrochemical Society Meeting, Paris 2003.

  110. DIFFUSION IN DIAMOND-LIKE CARBON H. Kröger, C. Ronning, H. Hofsäss, P. Neumaier, L. Görgens, G. Dollinger, Diam. Rel. Mat. 12 (2003) 2042.

  111. TRANSVERSE COOLING AND HEATING IN ION CHANNELING F. Grüner; W. Assmann; F. Bell; M. Schubert; J.U. Andersen; S. Karamian; A. Bergmaier; G. Dollinger; L. Goergens; W. Gunther; M. Toulemonde, Phys. Rev.B 68 (2003) 174104.

  112. DIAMOND FIELD EFFECT TRANSISTORS-CONCEPTS AND CHALLENGES A. Aleksov, M. Kubovic, N. Kaeb, U. Spitzberg, A. Bergmaier, G. Dollinger, T. Bauer, M. Schreck, B. Stritzker, E. Kohn, Diam. Rel. Mat. 12 (2003) 391.

  113. DESIGN OF THE MUNICH MICROPROBE FACILITY FOR SINGLE-ION IRRADIATION OF CELLS A. Hauptner, G. Datzmann, G. Dollinger, H.-J. Körner, P. Reichart, O. Schmelmer; Rad. Res. 158 (2002) 367.

  114. GROWTH AND PROPERTIES OF CVD DIAMOND FILMS GROWN UNDER H2S ADDITION H. Sternschulte, M. Schreck, B. Stritzker, A. Bergmaier, G. Dollinger, Diam. Rel. Mat. 12 (2003) 318.

  115. HIGH RESOLUTION ELASTIC RECOIL DETECTION G. Dollinger, A. Bergmaier, L. Goergens, P. Neumaier, W. Vandervorst, S. Jakschik, Infineon Technologies, Nucl. Instr. and Meth. B 219-220 (2004) 333 – 343.

  116. MICROIRRADIATION OF CELLS WITH ENERGETIC HEAVY IONS A. Hauptner, S. Dietzel, G.A. Drexler, P. Reichart, R. Krücken, T. Cremer, A.A. Friedl, G. Dollinger, Radiat. Environ. Biophys 42 (2004) 237.

  117. ANTIREFLECTION FOILS WITH MULTI-LAYER CONVERTER FOR ULTRACOLD NEUTRON DETECTORS P. Maier-Komor, I. Altarev, A. Bergmaier, P. Böni, G. Dollinger, R. Krücken, S. Paul, W. Schott, Nucl. Instr. and Meth. A 521 (2004) 242.

  118. A NEW UHV SYSTEM FOR THE PREPARATION OF CARBON STRIPPER FOILS BY LASER PLASMA ABLATION DEPOSITION P. Maier-Komor, G. Dollinger, R. Krücken, Nucl. Instr. and Meth. A 521 (2004) 176.

  119. THE MUNICH MICROPROBE SETUP FOR SINGLE-ION IRRADIATION OF CELLS A. Hauptner, G. Dollinger, G. Datzmann, H.-J. Körner, R. Krücken, P. Reichart, O. Schmelmer; Rad. Res. 161 (2004) 98.

  120. ERRORS IN NEAR-SURFACE AND INTERFACIAL PROFILE OF BORON AND ARSENIC W. Vandervorst, T. Janssens, B. Brijs, T. Conard, C. Huyghebaert, J. Fruehauf, A. Bergmaier, G. Dollinger, T. Buyuklimanli, J.A. VandenBerg, K. Kimura, Appl. Surf. Sci. 231 – 232 (2004) 618 – 631.

  121. PHYSICAL CHARACTERISATION OF MIXED HfAlOx LAYERS BY COMPLEMENTARY ANALYSIS TECHNIQUES H. Bender Th. Conard, O. Richard, B. Brijs, J. Pétry, W. Vandervorst, Chr. Defranoux, P. Boher, N. Rochat, C. Wyon, P. Mack, J. Wolstenholme, R. Vitchev, L. Houssiau, J.-J. Pireaux, A. Bergmaier, G. Dollinger, Mat. Sci. Engeneer. B 109 (2004) 60 – 63.

  122. 3D HYDROGEN MICROSCOPY WITH SUP-PPM DETECTION LIMIT P. Reichart, G. Dollinger, A. Bergmaier, G. Datzmann, A. Hauptner, H.-J. Körner, R. Krücken, Nucl. Instr. and Meth. B 219-220 (2004) 980.

  123. THREE-DIMENSIONAL HYDROGEN MICROSCOPY IN DIAMOND P. Reichart, G. Datzmann, A. Hauptner, R. Hertenberger, C. Wild, and G. Dollinger, Science 306 (2004) 1537-1540.

  124. BASIC ASPECTS OF DEEP LITHOGRAPHY WITH PARTICLES FOR THE FABRICATION OF MICRO-OPTICAL AND MICRO-MECHANICAL STRUCTURES B. Volckaerts, P. Vynck, M. Vervaeke, L. Cosentino, P. Finocchiaro, P. Reichart, G. Datzmann, A. Hauptner, G. Dollinger, A. Hermanne, H. Thienpont, Proceedings of SPIE -- Volume 5454, Micro-Optics: Fabrication, Packaging, and Integration, Peter Van Daele, Juergen Mohr, Editors, September 2004, pp. 52-63.

  125. HIGHLY SI-DOPED ALN GROWN BY PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY M. Hermann, F. Furtmayr, A. Bergmaier, G. Dollinger, M. Stutzmann, M. Eickhoff, Appl. Phys. Lett. 86 (2005) 192108.

  126. MICROIRRADIATION OF CELLS WITH ENERGETIC HEAVY IONS G. Dollinger, V. Hable, A. Hauptner, R. Krücken, P. Reichart, A.A. Friedl, G. Drexler, T. Cremer and S. Dietzel, Nucl. Instr. and Meth. 231 (2005) 195 – 201.